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Application of PoF Based Virtual Qualification Methods for Reliability Assessment of Mission Critical PCBsReliability is the ability of a product to perform the function for which it was intended for a specified period of time (or cycles) for a given set of life cycle conditions. In today's compressed mission development cycles where designing, building and testing the physical models has to occur in a matter of months not years, Projects don't have the luxury of iteratively building and testing those models. Physics of failure (PoF) is an engineering-based approach to reliability that begins with an understanding of materials, processes, physical interactions, degradation and failure mechanisms, as well as identifying failure models. The PoF approach uses modeling and simulation to qualify a design and manufacturing process, with the ultimate intent of eliminating failures early in the design process by addressing the root cause. The physics-of-failure analysis proactively incorporates reliability into the design process by establishing a scientific basis for evaluating new materials, structures and technologies. Virtual physics-of-failure modeling allows engineers to determine if new technological node can be added to an existing system. This presentation will illustrate an application of a PoF based tool during the initial phases of a printed circuit board assembly development and how the NASA GSFC team was able to dynamically study the effects of electronics parts and printed circuit board material configuration changes under simulated thermal and vibrational stresses.
Document ID
20190001856
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Sood, Bhanu
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
March 25, 2019
Publication Date
September 3, 2018
Subject Category
Quality Assurance And Reliability
Report/Patent Number
GSFC-E-DAA-TN58543
GSFC-E-DAA-TN66494
Report Number: GSFC-E-DAA-TN58543
Report Number: GSFC-E-DAA-TN66494
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Technical Review
Single Expert
Keywords
Physics of Failure
Printed circuit boards
Electronics Packaging
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