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Functional Fault Model Development Process to Support Design Analysis and Operational AssessmentA functional fault model (FFM) is an abstract representation of the failure space of a givensystem. As such, it simulates the propagation of failure effects along paths between the origin ofthe system failure modes and points within the system capable of observing the failure effects. Asa result, FFMs may be used to diagnose the presence of failures in the modeled system. FFMsnecessarily contain a significant amount of information about the design, operations, and failuremodes and effects. One of the important benefits of FFMs is that they may be qualitative, ratherthan quantitative and, as a result, may be implemented early in the design process when there ismore potential to positively impact the system design. FFMs may therefore be developed andmatured throughout the monitored system's design process and may subsequently be used toprovide real-time diagnostic assessments that support system operations. This paper provides anoverview of a generalized NASA process that is being used to develop and apply FFMs. FFMtechnology has been evolving for more than 25 years. The FFM development process presented inthis paper was refined during NASA's Ares I, Space Launch System, and Ground SystemsDevelopment and Operations programs (i.e., from about 2007 to the present). Process refinementtook place as new modeling, analysis, and verification tools were created to enhance FFMcapabilities. In this paper, standard elements of a model development process (i.e., knowledgeacquisition, conceptual design, implementation & verification, and application) are describedwithin the context of FFMs. Further, newer tools and analytical capabilities that may benefit thebroader systems engineering process are identified and briefly described. The discussion isintended as a high-level guide for future FFM modelers.
Document ID
20190004988
Acquisition Source
Glenn Research Center
Document Type
Presentation
Authors
Melcher, Kevin J.
(NASA Glenn Research Center Cleveland, OH, United States)
Maul, William A.
(Vantage Partners, LLC Brook Park, OH, United States)
Hemminger, Joseph A.
(ZIN Technologies, Inc. Brook Park, OH, United States)
Date Acquired
May 6, 2019
Publication Date
September 13, 2016
Subject Category
Electronics And Electrical Engineering
Quality Assurance And Reliability
Report/Patent Number
GRC-E-DAA-TN64548
Report Number: GRC-E-DAA-TN64548
Meeting Information
Meeting: American Institute of Aeronautics and Astronautics (AIAA) Space Forum
Location: Long Beach, CA
Country: United States
Start Date: September 13, 2016
End Date: September 16, 2016
Sponsors: American Institute of Aeronautics and Astronautics (AIAA)
Funding Number(s)
CONTRACT_GRANT: NNC12BA01B
WBS: 585777.02.20.03.02.30
Distribution Limits
Public
Copyright
Public Use Permitted.
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