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WFIRST Grism CharacterizationWe had presented the optical design and early test result of WFIRST grism spectrometer in previous SPIE conferences. This paper reports the follow-on activity of the spectral and radiometric calibrations, including the calibration methods, experiment designs, and test equipment calibration, such as the light source and detectors used in the test. The real grism calibration includes the throughput versus wavelength, which is largely determined by the diffraction efficiency of the two diffractive surfaces. It also includes spectral resolution, point spread function, and encircle energy measurements. The measured data are presented. The comparisons between the test data and the simulation from theory or optical model are also presented.
Document ID
20190029124
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Gong, Qian
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Bergkoetter, Matthew
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Berrier, Joshua
(Applied Technology Associates (ATA) Aerospace Greenbelt, MD, United States)
Chambers, Victor
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Dominguez, Margaret
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Fincher, Wesley
(Applied Technology Associates (ATA) Aerospace Greenbelt, MD, United States)
Hagopian, John
(Applied Technology Associates (ATA) Aerospace Greenbelt, MD, United States)
Marx, Catherine
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
August 16, 2019
Publication Date
August 11, 2019
Subject Category
Instrumentation And Photography
Optics
Report/Patent Number
GSFC-E-DAA-TN72300
Meeting Information
Meeting: SPIE Optics + Photonics
Location: San Diego, CA
Country: United States
Start Date: August 11, 2019
End Date: August 15, 2019
Sponsors: International Society for Optical Engineering
Funding Number(s)
CONTRACT_GRANT: NNG15CR64C
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
Single Expert
Keywords
Optics
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