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Proton Testing of nVidia Jetson TX2Single-Event Effects (SEE) testing was conducted on the nVidia Jetson TX2 System on Chip (SOC). Testing was conducted at Massachusetts General Hospital's (MGH) Francis H. Burr Proton Therapy Center on June 2nd, 2019.
Document ID
20190031856
Acquisition Source
Goddard Space Flight Center
Document Type
Other
Authors
Wyrwas, E. J. (Science Systems and Applications, Inc. (SSAI) Lanham, MD, United States)
Date Acquired
September 27, 2019
Publication Date
July 22, 2019
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN72754
Report Number: GSFC-E-DAA-TN72754
Funding Number(s)
CONTRACT_GRANT: 80GSFC18C0120
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
Single Expert
Keywords
System on Chip (SOC)
Single-Event Effects (SEE) testing
Flip Chip
Jetson TX2
Ball Grid Array (BGA)
single event functional interrupt (SEFI)
nVidia

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