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Total Ionizing Dose Test of Analog Devices’ AD654 Voltage to Frequency ConverterAnalog Devices’ AD654 was tested for total ionizing dose (TID) response beginning on February 13, 2017. This device has the Radiation Effects and Analysis Group Identification (REAG ID) number 16-036. This test served as the radiation lot acceptance test (RLAT) for the lot date code (LDC) tested. Low dose rate (LDR) irradiations were performed in this test so that the device susceptibility to enhanced low dose rate sensitivity (ELDRS) could be determined.
Document ID
20205002048
Acquisition Source
Goddard Space Flight Center
Document Type
Other - Test report for posting on Public Web Site
External Source(s)
https://radhome.gsfc.nasa.gov/
Authors
B. Freeman (Goddard Space Flight Center Greenbelt, Maryland, United States)
M. Campola (Goddard Space Flight Center Greenbelt, Maryland, United States)
Date Acquired
May 11, 2020
Publication Date
April 27, 2017
Publication Information
Subject Category
Electronics And Electrical Engineering
Space Radiation
Funding Number(s)
PROJECT: 2017-561-RESTORE
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Technical Review
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