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Recent Radiation Test Results on a 22FDX Test VehicleTotal ionizing dose irradiations were performed on a 22 nm fully-depleted silicon-on-insulator static random access memory. There is a strong well-bias effect in the TID response. Combined TID and SEE results are also presented.
Document ID
20205003434
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Megan C. Casey (Goddard Space Flight Center Greenbelt, Maryland, United States)
Scott Stansberry (Science Systems and Applications (United States) Lanham, Maryland, United States)
Christina Seidleck (Science Systems and Applications (United States) Lanham, Maryland, United States)
Jonathan A. Pellish (Goddard Space Flight Center Greenbelt, Maryland, United States)
Date Acquired
June 10, 2020
Publication Date
June 15, 2020
Publication Information
URL: https://nepp.nasa.gov/
Subject Category
Space Radiation
Meeting Information
Meeting: NCTS #41535-20 --- 2020 NEPP Electronics Technology Workshop (ETW)
Location: NASA Goddard, Greenbelt, MD
Country: US
Start Date: June 15, 2020
End Date: June 18, 2020
Sponsors: Goddard Space Flight Center
Funding Number(s)
WBS: 724297.40.49.04.01
CONTRACT_GRANT: 80GSFC18C0120
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
Single Expert
Keywords
total ionizing dose
single-event effects
combined radiation effects
fully-depleted silicon-on-insulator

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