Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Megan C. Casey (Goddard Space Flight Center Greenbelt, Maryland, United States) Scott Stansberry (Science Systems and Applications (United States) Lanham, Maryland, United States) Christina Seidleck (Science Systems and Applications (United States) Lanham, Maryland, United States) Jonathan A. Pellish (Goddard Space Flight Center Greenbelt, Maryland, United States) Date Acquired
June 25, 2020
Publication Date
July 10, 2020
Publication Information
URL: https://nepp.nasa.gov/
Subject Category
Electronics And Electrical Engineering Meeting Information
Meeting: NCTS #41535-20 --- 2020 NEPP Electronics Technology Workshop (ETW)
Location: NASA Goddard, Greenbelt, MD
Country: US
Start Date: June 15, 2020
End Date: June 18, 2020
Sponsors: Goddard Space Flight Center
Funding Number(s)
WBS: 724297.40.49.04.01
CONTRACT_GRANT: 80GSFC18C0120
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
Single Expert
Keywords
total ionizing dosesingle-event effectscombined radiation effectsfully-depleted silicon-on-insulator