Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
R A Austin (Vanderbilt University Nashville, Tennessee, United States) B D Sierawski (Vanderbilt University Nashville, Tennessee, United States) J M Trippe (Vanderbilt University Nashville, Tennessee, United States) K L Ryder (Vanderbilt University Nashville, Tennessee, United States) J M Petrin (Vanderbilt University Nashville, Tennessee, United States) A L Sternberg (Vanderbilt University Nashville, Tennessee, United States) R A Reed (Vanderbilt University Nashville, Tennessee, United States) A F Witulski (Vanderbilt University Nashville, Tennessee, United States) N Mahadevan (Vanderbilt University Nashville, Tennessee, United States) G Karsai (Vanderbilt University Nashville, Tennessee, United States) R D Schrimpf (Vanderbilt University Nashville, Tennessee, United States) K M Warren (Vanderbilt University Nashville, Tennessee, United States) R A Weller (Vanderbilt University Nashville, Tennessee, United States) K A LaBel (National Aeronautics and Space Administration Washington D.C., District of Columbia, United States) J W Evans (National Aeronautics and Space Administration Washington D.C., District of Columbia, United States) F J Groen (National Aeronautics and Space Administration Washington D.C., District of Columbia, United States) Date Acquired
August 13, 2020
Publication Date
May 22, 2017
Publication Information
Publication: Public website https://nepp.nasa.gov/
Publisher: NASA Electronic Parts and Packaging (NEPP) Program
URL: https://nepp.nasa.gov/
Subject Category
Quality Assurance And ReliabilityElectronics And Electrical Engineering Meeting Information
Meeting: 26th Annual Single Event Effects (SEE) Symposium – Military and Aerospace Programmable Logic Devices (MAPLD) Workshop
Location: La Jolla, CA
Country: US
Start Date: May 22, 2017
End Date: May 25, 2017
Sponsors: SEE Symposium
Funding Number(s)
CONTRACT_GRANT: NNX15AV48G
WBS: 724297.40.49.04.01
Distribution Limits
Public
Copyright
Portions of document may include copyright protected material.
Technical Review
Single Expert
