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NASA Goddard Space Flight Center’s Compendium of Radiation Effects Test ResultsTotal ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include FETs, flash memory, FPGAs, optoelectronics, digital, analog, and bipolar devices.
Document ID
20205009313
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Alyson D. Topper
(Science Systems and Applications (United States) Lanham, Maryland, United States)
Jean-Marie Lauenstein
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Edward P. Wilcox
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Melanie D. Berg
(Science Systems and Applications (United States) Lanham, Maryland, United States)
Michael J. Campola
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Megan C. Casey
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Edward J. Wyrwas
(Science Systems and Applications (United States) Lanham, Maryland, United States)
Martha V. O’Bryan
(Science Systems and Applications (United States) Lanham, Maryland, United States)
Thomas A. Carstens
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Caroline M. Fedele
(Goddard Space Flight Center Greenbelt, Maryland, United States)
James D. Forney
(Science Systems and Applications (United States) Lanham, Maryland, United States)
Hak S. Kim
(Science Systems and Applications (United States) Lanham, Maryland, United States)
Jason M. Osheroff
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Anthony M. Phan
(Science Systems and Applications (United States) Lanham, Maryland, United States)
Max F. Chaiken
(Glenn Research Center Cleveland, Ohio, United States)
Donna J. Cochran
(Science Systems and Applications (United States) Lanham, Maryland, United States)
Jonathan A. Pellish
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Peter J. Majewicz
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Date Acquired
October 28, 2020
Publication Date
December 7, 2020
Publication Information
Publication: Presentation only (no video) for posting on public website https://radhome.nasa.gov/
Publisher: NASA GSFC Radiation Effects and Analysis Group
URL: https://radhome.nasa.gov/
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: IEEE Nuclear and Space Radiation Effects Conference (NSREC), virtual event
Location: virtual event
Country: US
Start Date: November 29, 2020
End Date: December 30, 2020
Sponsors: Institute of Electrical and Electronics Engineers
Funding Number(s)
CONTRACT_GRANT: 80GSFC18C0120
WBS: 724297.40.49.04.01
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Technical Review
Single Expert
Keywords
Single Event Effects (SEE)
Total Ionizing Dose (TID)
displacement damage
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