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Threats to Resiliency of Redundant Systems Due to Destructive SEEDestructive SEE pose serious challenges for the reliable use of COTS devices in space systems. We used system-level modeling to determine SEL rates that would likely compromise system reliability, resilience and capabilities. We then assembled a representative dataset of COTS CMOS parts and used nonparametric statistical techniques to assess the threat posed to redundant systems by destructive SEE.
Document ID
20205009334
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
R. Ladbury
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Michael Bay
(Bay Engineering Innovations, Inc.)
Jeff Zinchuk
(Bay Engineering Innovations, Inc.)
Date Acquired
October 28, 2020
Publication Date
April 1, 2021
Publication Information
Publication: IEEE Transactions on Nuclear Science
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
ISSN: 0018-9499
e-ISSN: 1558-1578
URL: https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=23
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: Nuclear & Space Radiation Effects Conference
Location: Online
Country: US
Start Date: November 29, 2020
End Date: December 30, 2020
Sponsors: Institute of Electrical and Electronics Engineers
Funding Number(s)
WBS: 724297.40.49.04.01
Distribution Limits
Public
Copyright
Portions of document may include copyright protected material.
Technical Review
External Peer Committee
Keywords
single-event effects
single-event latchup
reliability estimation
quality assurance
statistical techniques
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