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The Future of Electronics Single Event Effects (SEE) TestingIn this presentation, the driving factors changing the world of single-event effects (SEE) testing will be discussed. This includes both semiconductor technological advances and morphing space system philosophies. Considerations for meeting these new challenges will then follow.
Document ID
20210010506
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
External Source(s)
https://nepp.nasa.gov/
Authors
Kenneth A Label (National Aeronautics and Space Administration Washington D.C., District of Columbia, United States)
Date Acquired
February 23, 2021
Publication Date
March 16, 2021
Publication Information
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: Radiation Effects Bootcamp on-line class at Texas A&M University
Location: Virtual
Country: US
Start Date: March 16, 2021
End Date: March 18, 2021
Sponsors: Texas A&M University Cyclotron Institute
Funding Number(s)
WBS: 724297.40.49.03.01
Distribution Limits
Public
Copyright
Portions of document may include copyright protected material.
Technical Review
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