A 96% Alumina based Packaging System for 500°C Test of SiC Integrated CircuitsWith the development of silicon carbide (SiC) sensors and electronic devices for operation at 500°C, compatible packaging technologies are needed for long term high temperature test and deployment of these sensors and electronic devices. 96% Al2O3 ceramic is an excellent electrically insulating material with acceptable dielectric constant and low dielectric loss over wide temperature and frequency ranges. This paper presents a packaging system for low power integrated circuits including a prototype 8-I/O chip-level package and printed circuit board (PCB) based on 96% Al2O3 ceramic substrates and Au thick-film metallization for 500°C applications. The details related to designs of packages and PCBs, packaging materials, and specific packaging step recipes including wire - bonding and die-attach, are presented. Some test results of this prototype packaging approach applied to SiC integrated circuits at 500oC are reviewed.
Document ID
20210014612
Acquisition Source
Glenn Research Center
Document Type
Presentation
Authors
Liangyu Chen (Ohio Aerospace Institute Cleveland, Ohio, United States)
Philip G. Neudeck (Glenn Research Center Cleveland, Ohio, United States)
David J. Spry (Glenn Research Center Cleveland, Ohio, United States)
Glenn M. Beheim (Glenn Research Center Cleveland, Ohio, United States)
Gary W. Hunter (Glenn Research Center Cleveland, Ohio, United States)
Date Acquired
April 27, 2021
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: iMAPS Technology Crossover Extravaganza
Location: Virtual
Country: US
Start Date: April 26, 2021
End Date: April 29, 2021
Sponsors: International Microelectronics Assembly & Packaging Society