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SEE Test Report for Texas Instruments TLV5618 2.7-V to 5.5-V Low-Power Dual 12-Bit Digital-to-Analog Converter with Power DownThe primary purpose of this testing was to characterize the Texas Instruments TLV5618 12-bit digital-to-analog converter (DAC) for single-event latchup (SEL) susceptibility. These data will be used to assess the SEL risk for the OSIRIS-REx Laser Altimeter (OLA). A secondary goal is to assess the susceptibility of the DAC to single-event transients (SET), single-event upsets (SEU), and other nondestructive SEE.
Document ID
20210015884
Acquisition Source
Goddard Space Flight Center
Document Type
Technical Memorandum (TM)
Authors
Raymond Ladbury
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Date Acquired
May 20, 2021
Publication Date
June 1, 2021
Publication Information
URL: https://radhome.gsfc.nasa.gov/
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
NASA/TM-20210015884
Funding Number(s)
PROJECT: OSIRIS-REX
WBS: 828928.03.0204
WBS: 817091.40.31.51
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Technical Review
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