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All optical methods to evaluate defects and performance of sensor materialsTo develop fast and low cost all optical methods to estimate defects in sensor materials.
Document ID
20220004284
Acquisition Source
Marshall Space Flight Center
Document Type
Presentation
Authors
Brett Setera (University of Maryland, Baltimore County Baltimore, Maryland, United States)
Ian Emge (Universities Space Research Association Columbia, Maryland, United States)
Ching Hua Su (Marshall Space Flight Center Redstone Arsenal, Alabama, United States)
Bradley Arnold (University of Maryland, Baltimore County Baltimore, Maryland, United States)
Fow-Sen Choa (University of Maryland, Baltimore County Baltimore, Maryland, United States)
Brian Cullum (University of Maryland, Baltimore County Baltimore, Maryland, United States)
N. B. Singh (University of Maryland, Baltimore County Baltimore, Maryland, United States)
Date Acquired
March 11, 2022
Subject Category
Optics
Electronics And Electrical Engineering
Meeting Information
Meeting: SPIE Defense and Commercial Sensing
Location: Orlando, FL
Country: US
Start Date: April 3, 2022
End Date: April 7, 2022
Sponsors: International Society for Optics and Photonics
Funding Number(s)
WBS: 619352.05.15.01.04
Distribution Limits
Public
Copyright
Public Use Permitted.

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