NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login

Press Enter or click the Search button to begin your search.

Back to Results
Reliability Assurance for COTS CapacitorsBurn-in (BI) and life testing (LT) are the most important reliability related elements of quality assurance for components used in space systems. This presentation discusses the need of transition from the existing approach to BI, LT, and destructive physical analysis (DPA) of COTS capacitors that is based on military specifications to an alternative approach that is based on Physics of Failure and HALT.
Document ID
20220007287
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Alexander Teverovsky (Jacobs (United States) Dallas, Texas, United States)
Date Acquired
May 10, 2022
Publication Date
June 13, 2022
Publication Information
URL: https://nepp.nasa.gov/
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: NEPP Electronics Technology Workshop (ETW)
Location: Greenbelt, MD
Country: US
Start Date: June 13, 2022
End Date: June 16, 2022
Sponsors: National Aeronautics and Space Administration
Funding Number(s)
WBS: 817091.40.31.51.02
CONTRACT_GRANT: 80GSFC18C0120
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
NASA Peer Committee
Keywords
reliability
ceramic capacitors
commercial off the shelf (COTS)

Related Records

There are no records associated with this record.
No Preview Available