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Microcalorimeter Absorber Optimization for 0.2 to 12 keV X-RaysThe Advanced Telescope for High ENergy Astrophysics (ATHENA) mission requires high quantum efficiency (QE) x-ray absorption, >90.6% at 7 keV and low specific heat capacity, 0.731 pJ/K. The designed ATHENA x-ray absorbers are cantilevered square tiles (pitch of 317 microns) of 1.05 μm thick Au and 5.51 μm thick Bi electroplated films supported by stems that connect the absorber to the detector below. We discuss some of the methods used to produce x-ray absorbers meeting these specifications for ATHENA. To tune the thermal conductance of the device and the effect on the normal-to superconducting transition shape, the stems need to be small diameter and can have a weak bottle-neck connection to the substrate. A funnel shape of the stem using a proximity exposed photoresist mold has been developed to improve the strength of the connections. Further requirements on the absorbers include low levels of fine particulate remaining on the substrate after production and zero shorts between absorbers due to incomplete ion milling or trapped fine particular between absorbers. To optimize for post patterning substrate cleanliness and absorber yield, we have examined several methods of absorber fabrication. Three such methods are 1) an ion mill/wet etch combination, 2) a photoresist mold for electroplating followed by wet or dry etch to remove the seed layer, and 3) an electroplating process with leveling to smooth the surface followed by ion mill to separate the absorbers. The different combinations of wet and dry etches lead to different yields and surface appearance of the absorber sidewalls. We present results on the achieved pixel yields and the energy resolution of pixels made with the various fabrication methods. We discuss the impact of absorber patterning method on performance, uniformity, and yield.
Document ID
20220013541
Acquisition Source
Goddard Space Flight Center
Document Type
Poster
Authors
Edward J Wassell
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Joseph S Adams
(University of Maryland, Baltimore County Baltimore, Maryland, United States)
Simon R Bandler
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Sophie Beaumont
(University of Maryland, Baltimore County Baltimore, Maryland, United States)
Rachel Borrelli
(Goddard Space Flight Center Greenbelt, Maryland, United States)
James A Chervenak
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Fred M Finkbeiner
(Hexagon (United States) Madison, Alabama, United States)
Jong Yoon Ha
(SB Microsystems)
Samuel V Hull
(Oak Ridge Associated Universities Oak Ridge, Tennessee, United States)
Richard L Kelley
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Caroline A Kilbourne
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Jennette N Mateo
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Vilem Mikula
(Science Systems and Applications (United States) Lanham, Maryland, United States)
Antoine R Minussi
(University of Maryland, Baltimore County Baltimore, Maryland, United States)
Haruka Muramatsu
(Catholic University of America Washington D.C., District of Columbia, United States)
Frederick S Porter
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Asha Rani
(Science Systems and Applications (United States) Lanham, Maryland, United States)
Kazuhiro Sakai
(University of Maryland, Baltimore County Baltimore, Maryland, United States)
Stephen J Smith
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Nicholas A Wakeham
(University of Maryland, Baltimore County Baltimore, Maryland, United States)
Sang H Yoon
(Oak Ridge Associated Universities Oak Ridge, Tennessee, United States)
Date Acquired
September 2, 2022
Subject Category
Instrumentation and Photography
Meeting Information
Meeting: Applied Superconductivity Conference
Location: Honolulu, HI
Country: US
Start Date: October 23, 2022
End Date: October 28, 2022
Sponsors: Applied Superconductivity Educational Foundation
Funding Number(s)
WBS: 244904.04.10.01.02.02
CONTRACT_GRANT: 80GSFC21M0002
CONTRACT_GRANT: 80GSFC21M0002
CONTRACT_GRANT: 80GSFC17C0003
CONTRACT_GRANT: 80NSSC22FA386
CONTRACT_GRANT: 80HQTR21CA005
CONTRACT_GRANT: 80GSFC18C0120
Distribution Limits
Public
Copyright
Portions of document may include copyright protected material.
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