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Spoof Plasmon Sensing for NDE ApplicationNASA is exploring the use of microwave spoof plasmon polaritons to detect defects in metallic structures. This work investigates the detection of simulated defects in the form of aluminum wires as small as 1.6 mm diameter and 2 mm long that are placed in a grooved aluminum test article. The inclusions simulate manufacturing defects, and the sum of the delta impedance is shown to increase with increasing volume of added metal. Based on the results, a threshold value of 50Ω has been proposed for defect detection. In addition to detecting defects, the technique also estimates the volume of the defect.
Document ID
20220015273
Acquisition Source
Langley Research Center
Document Type
Presentation
Authors
William C. Wilson
(Langley Research Center Hampton, Virginia, United States)
Katelyn R. Brinker
(Iowa State University Ames, Iowa, United States)
Date Acquired
October 11, 2022
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: IEEE SENSORS 2022
Location: Dallas, TX
Country: US
Start Date: October 30, 2022
End Date: November 2, 2022
Sponsors: Institute of Electrical and Electronics Engineers
Funding Number(s)
WBS: 081876.02.07.50.15.01.04
Distribution Limits
Public
Copyright
Portions of document may include copyright protected material.
Technical Review
NASA Technical Management
Keywords
Microwave
Spoof Plasmon Polaritons
Electromagnetic
Surface Waves
NDE
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