Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Aubin Antonsanti (Southeastern Universities Research Association Washington D.C., District of Columbia, United States) Vincent Goiffon (National Higher School of Aeronautics and Space Toulouse, France) Franc¸ois Roy (STMicroelectronics (France) Montrouge, France) Alexandre Le Roch (Oak Ridge Associated Universities Oak Ridge, Tennessee, United States) Landen D Ryder (Goddard Space Flight Center Greenbelt, Maryland, United States) Victor Malherbe (STMicroelectronics (France) Montrouge, France) Philippe Roche (STMicroelectronics (France) Montrouge, France) Olivier Nier (STMicroelectronics (France) Montrouge, France) Cedric Virmontois (Centre National D'Etudes Spatiales Paris, France) Jean-Marie Lauenstein (Goddard Space Flight Center Greenbelt, Maryland, United States) Date Acquired
April 3, 2023
Publication Date
April 4, 2023
Publication Information
Publication: IEEE Transactions on Nuclear Science
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Volume: 70
Issue Publication Date: April 1, 2023
ISSN: 0018-9499
e-ISSN: 1558-1578
Subject Category
Electronics and Electrical EngineeringSpace Radiation Meeting Information
Meeting: Radiation and its Effects on Components and Systems (RADECS)
Location: Venice
Country: IT
Start Date: October 3, 2022
End Date: October 7, 2022
Sponsors: iXBlue (France)
Funding Number(s)
WBS: 817091.40.31.51.04
CONTRACT_GRANT: 80GSFC21M0002
CONTRACT_GRANT: 80HQTR21CA005
Distribution Limits
Public
Copyright
Portions of document may include copyright protected material.
Technical Review
Single Expert
Keywords
CMOS Image Sensor (CIS)Total Ionizing Dose (TID)Metal-Oxide-Semiconductor (MOS)Interface-StatesOxide-TrapsCapacitive Deep Trench Isolation (CDTI)X-rays