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Assessment of Electrical, Electronic, and Electromechanical (EEE) Parts Copper Wire Bonds for Space ProgramsThe NASA Electronic Parts and Packaging Program co-manager, requested the NASA Engineering and Safety Center (NESC) to compile a body of publicly available knowledge on copper (Cu) wire bonds and perform reliability testing and analysis on these bonds, including environment tests, sample destructive physical analysis, and bond pull/shear tests during environment test intervals. The goal was to understand the risks of using Cu wire bonds for space applications and develop guidelines on Cu bond pull/shear limits for NASA applications. This document contains the results of the NESC assessment.
Document ID
20230014536
Acquisition Source
Langley Research Center
Document Type
Technical Memorandum (TM)
Authors
Robert F Hodson
(Langley Research Center Hampton, Virginia, United States)
Linda Y Del Castillo
(Jet Propulsion Lab La Cañada Flintridge, California, United States)
Yuan Chen
(Langley Research Center Hampton, Virginia, United States)
Reza Ghaffarian
(Jet Propulsion Lab La Cañada Flintridge, California, United States)
Lyudmyla P Ochs
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Eric M Galloway
(Science Systems and Applications (United States) Lanham, Maryland, United States)
Date Acquired
October 5, 2023
Publication Date
October 1, 2023
Subject Category
Space Transportation and Safety
Report/Patent Number
NESC-RP-18-01317
NASA/TM-20230014536
Funding Number(s)
WBS: 869021.01.23.01.01
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
NASA Peer Committee
Keywords
Electrical, Electronic, and Electromechanical
NASA Engineering and Safety Center
Copper Wire Bonds
Testing and Analysis
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