NASA Engineering and Safety Center Technical Bulletin No. 23-07: Best Practices for Fabrication of Microelectronic Devices

Material degradation during the fabrication of microelectronic devices has plagued the space industry for many years owing to the layering of many dissimilar metals to create these devices. Often, commonly used materials and systems are overlooked as potential sources of material degradation. This technical bulletin highlights extensive research to isolate probable causes of this degradation.