Acquisition Source
Langley Research Center
Document Type
Conference Paper
Authors
Peter W. Spaeth (Langley Research Center Hampton, United States) Erik L. Frankforter (Langley Research Center Hampton, United States) Samuel J. Hocker (Langley Research Center Hampton, United States) Joseph N. Zalameda (Langley Research Center Hampton, United States) Date Acquired
March 6, 2024
Report/Patent Number
202400027672024000255520230012996 Meeting Information
Meeting: SPIE Smart Structures and NDE
Location: Long Beach, CA
Country: US
Start Date: March 25, 2024
End Date: March 28, 2024
Sponsors: International Society for Optics and Photonics
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Technical Review
Single Expert
Keywords
Data fusionX-ray Computed Tomographyimage segmentationsupervised classificationsurface profilometryadditive manufacturingimage registration