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Design for Inspection: A Formalized Approach to Evaluating the Inspectability of Aerospace Structures Early in the Design ProcessNDE engineers are often confronted with structural design choices that present challenges to meeting inspection requirements. These challenges at best increase the resources needed to design an inspection solution and, at worst, require resource intensive redesign of the structure. If the inspectability of structure can be determined early in the design cycle, these challenging inspection scenarios can be avoided.
Therefore, there exists a need for a resource friendly formalized approach to gauge the inspectability of a structure. This paper proposes the use of a novel inspectability metric to meet this need. The inspectability metric is a standardized, automation friendly procedure that uses simulations to determine inspectability. It provides a suite of simulation tests to interrogate the ability to find defects and the sensitivity to variability. The testing rubric is designed to maximize the coverage of the parameter space while minimizing the number of simulations needed. In this preliminary study, we will demonstrate how the inspectability metric is able to determine the inspectability of a structure as a function of changes in the structure’s design.
Document ID
20240003953
Acquisition Source
Langley Research Center
Document Type
Presentation
Authors
Peter Juarez
(Langley Research Center Hampton, United States)
Starr Dauria
(Extende Inc)
Sébastien Lonne
(Extende Inc)
Bastien Clausse
(Extende Inc)
Hong Tat
(Boeing (United States) Chicago, United States)
Jill Bingham
(Boeing (United States) Chicago, United States)
Date Acquired
April 3, 2024
Subject Category
Aeronautics (General)
Meeting Information
Meeting: SAMPE 2024
Location: Long Beach, CA
Country: US
Start Date: May 20, 2024
End Date: May 23, 2024
Sponsors: SAMPE (Society for the Advancement of Materials and Process Engineering)
Funding Number(s)
WBS: 816088.04.07.03
Distribution Limits
Public
Copyright
Portions of document may include copyright protected material.
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