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Uncertainty Estimates for Fitting Zernike Polynomials to Discrete DataZernike polynomials are a widely used metric in modern optical analysis. They conveniently represent surfaces as a series of weighted terms corresponding to various optical aberrations. Ideally, each term is independent of others in the series, but Zernike polynomials lose this property when working with sets of discrete data. This gives rise to uncertainty in each polynomial’s actual contribution and affects metrology and simulation estimates of their relative weights. Several factors influencing these estimates are the number and arrangement of sample locations, the method for calculating the weights, and the total number of Zernike terms used in the calculation. Discussed is the uncertainty associated with linear regression using random sampling. Other topics reviewed are complex Zernike polynomials and vector spaces of functions.
Document ID
20240010407
Acquisition Source
Marshall Space Flight Center
Document Type
Presentation
Authors
Christopher L Hopkins
(Marshall Space Flight Center Redstone Arsenal, United States)
Date Acquired
August 9, 2024
Subject Category
Optics
Report/Patent Number
SPIE Proc. 13129-21
Meeting Information
Meeting: SPIE Optics & Photonics
Location: San Diego, CA
Country: US
Start Date: August 18, 2024
End Date: August 22, 2024
Sponsors: International Society for Optics and Photonics
Funding Number(s)
WBS: 399131.02.17.01.03
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Technical Review
NASA Technical Management
Keywords
Zernike Polynomials
Uncertainty Analysis
Orthographic Projection
Linear Regression
Gaussian Quadrature
Functional Analysis
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