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Mark II 500⁰C Oven Build InstructionsThis report provides details of the construction of the Mark II, a second-generation compact oven designed to test prototype silicon carbide devices at temperatures up to 500 °C. Improvements made to the original Mark I oven in the Mark II design include the ability to ramp the temperature gradually to a setpoint and to contain active cooling inside the oven.
Document ID
20250000442
Acquisition Source
Glenn Research Center
Document Type
Technical Memorandum (TM)
Authors
Siddh Jhaveri
(The Ohio State University Columbus, United States)
Stephanie Booth
(Glenn Research Center Cleveland, United States)
David Spry
(Glenn Research Center Cleveland, United States)
Date Acquired
January 14, 2025
Publication Date
June 1, 2025
Publication Information
Publisher: National Aeronautics and Space Administration
Subject Category
Electronics and Electrical Engineering
Mechanical Engineering
Report/Patent Number
E-20300
NASA/TM-20250000442
Funding Number(s)
WBS: 811073.02.14.03.30
Distribution Limits
Public
Copyright
Portions of document may include copyright protected material.
Technical Review
Single Expert
Keywords
testing
oven
SiC
high-temperature
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