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Solid State Drive Radiation Assurance With Active TestingSingle-event effects (SEE) and total ionizing dose (TID) data are presented for several automotive- and industrial-grade solid-state drives, and the effects of different active test configurations on hardness assurance are explored.
Document ID
20250000802
Acquisition Source
Goddard Space Flight Center
Document Type
Other - Paper to be posted on public website https://nepp.nasa.gov/
External Source(s)
https://nepp.nasa.gov/
Authors
Edward P Wilcox (Goddard Space Flight Center Greenbelt, United States)
Adia M Wood (Goddard Space Flight Center Greenbelt, United States)
Gregory R Allen (Jet Propulsion Laboratory La Cañada Flintridge, United States)
Martin A Carts (Goddard Space Flight Center Greenbelt, United States)
Megan C Casey (Goddard Space Flight Center Greenbelt, United States)
Date Acquired
January 21, 2025
Publication Date
July 19, 2024
Publication Information
Subject Category
Electronics and Electrical Engineering
Funding Number(s)
WBS: 817091.40.31.51.04
CONTRACT_GRANT: 80NM0018D0004
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
Single Expert
Keywords
dose
system
assurance
radiation
automotive
solid state drive
memory

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