Single-Event Effects Test Report Texas Instruments TDA4VM System on Chip

This report discusses the failure modes and heavy ion radiation sensitivity of the Texas Instruments Jacinto TDA4VM system on chip (SoC). The device was monitored for destructive events, unexpected current draw, and graphical display errors during exposure to a heavy ion beam at Lawrence Berkeley National Laboratory (LBNL)’s 88-inch cyclotron.

The purpose of the test was to determine the viability of using the TI AD4VM for general compute and its ability to render a high definition (1080p) display in space environments. The test was used to determine the effects of an operating system configuration representing different applications baselined for satellites and human-centric flight systems such as a display on a space suit or exploration vehicle with human-machine interfaces (HMI) that contain displays.