NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Advanced Thermal Inspection with Pulsed Light Emitting Diodes (PLED) Technology Typically for the thermal inspection of reflective surfaces, paint or other emissivity enhancing coatings are applied before inspection. A pulsed light emitting diodes (PLED) heat source is used. The PLED heat source is spectrally narrow, contained within the visible band, and therefore not detectable by the infrared camera. The PLED heat source is configured to reduce any transient cool down components that could produce false defect indications. The PLED thermal inspections are compared to commercially available flash thermography inspections on unpainted aluminum samples with simulated corrosion and additively manufactured Ti-6AL-4V metal specimens.
Document ID
20250006057
Acquisition Source
Langley Research Center
Document Type
Presentation
Authors
Joseph N. Zalameda
(Langley Research Center Hampton, United States)
Date Acquired
June 10, 2025
Subject Category
Instrumentation and Photography
Meeting Information
Meeting: Webinar - Larc TOPS-392
Location: Virtual
Country: US
Start Date: June 18, 2025
Sponsors: NASA Langley Research Center (LaRC)
Funding Number(s)
WBS: 109492.02.07.09.02.01
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Technical Review
Single Expert
Keywords
X-ray computed tomography
corrosion detection
crack detection
thermal nondestructive evaluation
additive manufacturing
No Preview Available