System-Level Single Event Effects Test Report - PIRT 1280MVCam InGaAs Infrared Camera

This irradiation test campaign was conducted to provide a “first pass screen” for persistent single event functional interrupts (SEFIs) and destructive single event effects in a commercial-off-the-shelf InGaAs camera system under consideration for space-based instrumentation. Testing was performed at NASA’s Space Radiation Laboratory (NSRL) at Brookhaven National Laboratory (BNL) to ensure that heavy ions had sufficient energy to pass through the camera housing and multiple stacked printed circuit boards.