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Achieving Improved Reliability with Failure AnalysisReliability is the ability of a product to properly function, within specified performance limits, for a specified period of time, under the life cycle application conditions. Failure analysis is a vital tool in the effort to ensure reliability of electronic products and systems throughout their product lifecycle. Today, organizations involved in activities within the electronics supply chain are facing new challenges, not just from complex assembly styles, harsher lifecycle environments, and sophisticated supply chains, but also from customers who are demanding a quicker turn-around. Unfortunately, root cause failure analysis is often performed incompletely, leading to a poor understanding of failure mechanisms and causes and, customer dissatisfaction due to recurring failures. The PDC starts with an introduction to reliability concepts, physics of failure and an overview of failure mechanisms that affect PCBs, PCBAs and components. The PDC then dives into root cause hypothesizing techniques (Pareto, FMEA, fishbone, FTA), non-destructive and destructive analysis and, materials characterization will be discussed. Numerous failure analysis case studies will be used to illustrate the techniques and analysis principles to arrive at the root cause(s) of field failures on printed circuit boards, active components, and assemblies. What Will You Learn: Topics include: Overview of Reliability Concepts Failure mechanisms of electronic products Root cause analysis Failure analysis techniques -Non-destructive techniques (optical, CSAM etc.) -Destructive analysis (DPA, Decap, FIB etc.) -Materials characterization (XRF, EDS, TMA/DSC etc.) Who Will Benefit: Reliability engineers, failure analysis engineers, engineering managers, design engineers, component engineers, quality assurance functions and, personnel involved with reliability activities within their company.
Document ID
20180003067
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Sood, Bhanu
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
May 25, 2018
Publication Date
May 15, 2018
Subject Category
Quality Assurance And Reliability
Report/Patent Number
GSFC-E-DAA-TN56355
Meeting Information
Meeting: IPC High Reliability Forum
Location: Baltimore, MD
Country: United States
Start Date: May 15, 2018
End Date: May 17, 2018
Sponsors: IPC - Association Connecting Electronics Industries
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
non-destructive techniques
destructive techniques
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