Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Hadaway, James B. (Alabama Univ. Huntsville, AL, United States) Wells, Conrad (Harris Corp. Rochester, NY, United States) Olczak, Gene A. (Harris Corp. Rochester, NY, United States) Waldman, Mark (Sigma Space Corp. Lanham, MD, United States) Whitman, Tony L. (Harris Corp. Rochester, NY, United States) Cosentino, Joseph (Harris Corp. Rochester, NY, United States) Zarella, Michael (Harris Corp. Rochester, NY, United States) Connelly, Mark (Harris Corp. Rochester, NY, United States) Chaney, David M. (Ball Aerospace and Technologies Corp. Boulder, CO, United States) Telfer, Randal (Space Telescope Science Inst. Baltimore, MD, United States) Date Acquired
July 25, 2018
Publication Date
June 10, 2018
Report/Patent Number
GSFC-E-DAA-TN57655Report Number: GSFC-E-DAA-TN57655 Meeting Information
Meeting: SPIE Astronomical Telescopes + Instrumentation
Location: Austin, TX
Country: United States
Start Date: June 10, 2018
End Date: June 15, 2018
Sponsors: International Society for Optical Engineering
Funding Number(s)
CONTRACT_GRANT: NAS5-03127
CONTRACT_GRANT: NAS5-02200
CONTRACT_GRANT: NNG11FD64C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
JWSToptical testinginterferometrymultiple-wavelength interferometerprimary mirrorcryogenicJames Webb Space Telescopeoptical metrology.