Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Lauenstein, Jean-Marie (NASA Goddard Space Flight Center Greenbelt, MD, United States) Date Acquired
October 4, 2018
Publication Date
February 6, 2018
Subject Category
Electronics And Electrical Engineering Report/Patent Number
2018-561-NEPPGSFC-E-DAA-TN59752 Meeting Information
Meeting: Microelectronics Reliability and Qualification Working Meeting (MRQW)
Location: El Segundo, CA
Country: United States
Start Date: February 6, 2018
End Date: February 8, 2018
Sponsors: Aerospace Corp.
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Technical Review
Single Expert
Keywords
MOSFETsSingle-event burnout (SEB)