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Development of X-Ray Computed Tomography Image Quality Indicators, "IQIs"The intent of this effort, which is funded through the NASA OSMA NDE Program, is to develop a methodology and tools to assess Computed Tomography (CT) system performance. In particular, our team has fabricated Image Quality Indicators (IQIs) using materials and internal features useful for assessing CT detectability limits, contrast sensitivity, and resolution. Unlike traditional 2D radiography IQIs, those for CT should be more conducive to volumetric datasets and of uniform aspect ratio cross-sections.
Document ID
20180007679
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Jones, Justin S.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Moreno, Antonio
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Landgrover, Olivia
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Fischetti, Grace
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
November 13, 2018
Publication Date
November 9, 2018
Subject Category
Quality Assurance And Reliability
Instrumentation And Photography
Report/Patent Number
GSFC-E-DAA-TN62812
Report Number: GSFC-E-DAA-TN62812
Meeting Information
Meeting: Langley Additive Manufacturing Mini-Technical Interchange Meeting (TIM)
Location: Hampton, VA
Country: United States
Start Date: November 9, 2018
Sponsors: NASA Langley Research Center
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
Additive Manufacturing
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