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Measurement selection for parametric IC fault diagnosisExperimental results obtained with the use of measurement reduction for statistical IC fault diagnosis are described. The reduction method used involves data pre-processing in a fashion consistent with a specific definition of parametric faults. The effects of this preprocessing are examined.
Document ID
19940013883
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Wu, A. (Washington State Univ. Pullman, WA, United States)
Meador, J. (Washington State Univ. Pullman, WA, United States)
Date Acquired
September 6, 2013
Publication Date
January 1, 1991
Publication Information
Publication: Idaho Univ., The 1991 3rd NASA Symposium on VLSI Design
Subject Category
Electronics And Electrical Engineering
Accession Number
94N18356
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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