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Preliminary Radiation Testing of a State-of-the-Art Commercial 14nm CMOS Processor - System-on-a-ChipHardness assurance test results of Intel state-of-the-art 14nm Broadwell U-series processor System-on-a-Chip (SoC) for total dose are presented, along with first-look exploratory results from trials at a medical proton facility. Test method builds upon previous efforts by utilizing commercial laptop motherboards and software stress applications as opposed to more traditional automated test equipment (ATE).
Document ID
20150017736
Document Type
Presentation
Authors
Szabo, Carl M., Jr. (ASRC Federal Space and Defense Greenbelt, MD, United States)
Duncan, Adam (Naval Surface Warfare Center Crane, IN, United States)
LaBel, Kenneth A. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Kay, Matt (Naval Surface Warfare Center Crane, IN, United States)
Bruner, Pat (Naval Surface Warfare Center Crane, IN, United States)
Krzesniak, Mike (Naval Surface Warfare Center Crane, IN, United States)
Dong, Lei (Scripps Proton Therapy Center San Diego, CA, United States)
Date Acquired
September 11, 2015
Publication Date
July 13, 2015
Subject Category
Space Radiation
Computer Programming and Software
Computer Operations and Hardware
Report/Patent Number
GSFC-E-DAA-TN24988
Meeting Information
Nuclear and Space Radiation Effects Conference (NSREC)(Boston, MA)
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
14nm
microprocessor
state-of-the-art
CPU
processor
radiation hardness
single event effects testing

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