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Preliminary Radiation Testing of a State-of-the-Art Commercial 14nm CMOS Processor/System-on-a-ChipHardness assurance test results of Intel state-of-the-art 14nm “Broadwell” U-series processor / System-on-a-Chip (SoC) for total ionizing dose (TID) are presented, along with exploratory results from trials at a medical proton facility. Test method builds upon previous efforts [1] by utilizing commercial laptop motherboards and software stress applications as opposed to more traditional automated test equipment (ATE).
Document ID
20150017737
Document Type
Conference Paper
Authors
Szabo, Carl M., Jr. (ASRC Federal Space and Defense Greenbelt, MD, United States)
Duncan, Adam (Naval Surface Warfare Center Crane, IN, United States)
LaBel, Kenneth A. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Kay, Matt (Naval Surface Warfare Center Crane, IN, United States)
Bruner, Pat (Naval Surface Warfare Center Crane, IN, United States)
Krzesniak, Mike (Naval Surface Warfare Center Crane, IN, United States)
Dong, Lei (Scripps Institution of Oceanography San Diego, CA, United States)
Date Acquired
September 11, 2015
Publication Date
July 15, 2015
Subject Category
Space Radiation
Computer Programming and Software
Report/Patent Number
GSFC-E-DAA-TN24989
Meeting Information
IEEE Nuclear and Space Radiation Effects Conference (NSREC)(Boston, MA)
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
microprocessor
14nm
state-of-the-art
radiation hardness
CPU
processor
single event effects testing

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IDRelationTitle20150017736See AlsoPreliminary Radiation Testing of a State-of-the-Art Commercial 14nm CMOS Processor - System-on-a-Chip