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Compendium of NASA Goddard Space Flight Center’s Recent Radiation Effects Test ResultsWe present results and analysis investigating the effects of radiation on a variety of candidate spacecraft electronics to heavy ion and proton induced single-event effects (SEE), proton-induced displacement damage dose (DDD), and total ionizing dose (TID).
Document ID
20240008403
Acquisition Source
Goddard Space Flight Center
Document Type
Poster
Authors
Martha V. O'bryan (Science Systems and Applications (United States) Lanham, Maryland, United States)
Seth S. Roffe (Goddard Space Flight Center Greenbelt, United States)
Edward P. Wilcox (Goddard Space Flight Center Greenbelt, United States)
Michael J. Campola (Goddard Space Flight Center Greenbelt, United States)
Jason M. Osheroff (Goddard Space Flight Center Greenbelt, United States)
Megan C. Casey (Goddard Space Flight Center Greenbelt, United States)
Matthew B. Joplin (Goddard Space Flight Center Greenbelt, United States)
Thomas A. Carstens (Goddard Space Flight Center Greenbelt, United States)
Jonathan D. Barth (Goddard Space Flight Center Greenbelt, United States)
Landen D. Ryder (Goddard Space Flight Center Greenbelt, United States)
Kaitlyn L. Ryder (Goddard Space Flight Center Greenbelt, United States)
Adia M. Wood (Goddard Space Flight Center Greenbelt, United States)
Jean-Marie Lauenstein (Goddard Space Flight Center Greenbelt, United States)
Peter J. Majewicz (Langley Research Center Hampton, United States)
Date Acquired
July 1, 2024
Publication Date
July 22, 2024
Publication Information
Publisher: NASA Electronic Parts and Packaging (NEPP) Program
URL: https://nepp.nasa.gov/
Subject Category
Life Sciences (General)
Meeting Information
Meeting: IEEE Nuclear and Space Radiation Effects Conference (NSREC)
Location: Ottawa
Country: CA
Start Date: July 22, 2024
End Date: July 26, 2024
Sponsors: Institute of Electrical and Electronics Engineers
Funding Number(s)
WBS: 817091.40.31.51.04
CONTRACT_GRANT: 80GSFC18C0120
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
Single Expert
Keywords
Single event effects
space radiation reliability
spacecraft electronics

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