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Compendium of Single Event Effect Results from NASA Goddard Space Flight CenterWe present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics.This paper is a summary of test results.
Document ID
20160009072
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
O'Bryan, Martha V. (ASRC Federal Space and Defense Greenbelt, MD, United States)
LaBel, Kenneth A. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Szabo, Carl M. (ASRC Federal Space and Defense Greenbelt, MD, United States)
Chen, Dakai (NASA Goddard Space Flight Center Greenbelt, MD United States)
Campola, Michael J, (NASA Goddard Space Flight Center Greenbelt, MD United States)
Casey, Megan C. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Lauenstein, Jean Marie (NASA Goddard Space Flight Center Greenbelt, MD United States)
Wilcox, Edward P. (ASRC Federal Space and Defense Greenbelt, MD, United States)
Ikpe, Stanley A. (NASA Langley Research Center Hampton, VA, United States)
Pellish, Jonathan A. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Berg, Melanie D. (ASRC Federal Space and Defense Greenbelt, MD, United States)
Date Acquired
July 15, 2016
Publication Date
July 11, 2016
Subject Category
Electronics And Electrical Engineering
Spacecraft Design, Testing And Performance
Report/Patent Number
GSFC-E-DAA-TN33485
Meeting Information
Meeting: Nuclear and Space Radiation Effects Conference (NSREC) 2016
Location: Portland, OR
Country: United States
Start Date: July 11, 2016
End Date: July 15, 2016
Sponsors: Institute of Electrical and Electronics Engineers
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
hybrid devices
linear bipolar
space radiation reliability
Single Event Effects (SEE)
digital
spacecraft electronics

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